Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas. Semilab offers a variety of measurement techniques; most of them are non-contact and non-destructive. Many of Semilab's technologies can be flexibly integrated in different platforms, ranging from simple handheld devices and table-top systems with high resolution mapping capability to fully automated stand-alone production control tools for mid-range and high-level fablines. Semilab also offers in-line measurements for solar cell production lines.
Our strategy is to continuously improve our products, and to offer flexible solutions for our customers' needs with high-value products for a reasonable price. To accomplish this, Semilab employs more than 70 physicists and 90 engineers worldwide. Semilab also participates in various international R&D projects, and Semilab has a frame agreement for metrology development with IMEC, the largest international research center for the development of semiconductor products.
Semilab carries out our work in a responsible way; Semilab provides various benefits to our employees and support important cases such as scientific education.
Dielectric Film Measurement By Ellipsometry: Principles, Applications And Benefits
Ellipsometry: What is it and Why is it Useful in Optics?
Ellipsometric Porosimetry: An Introduction
What is Spectroscopic Ellipsometry and Why is it Useful?
Spectroscopic Ellipsometer with Rotating Compensator - SE-2000
Cost-Effective Non-Destructive and Non-Contact Optical Measurements on Substrates - SE-1000
Ellipsometric Spectra Analysis at the Time of Layer Deposition - inSE-1000
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.