Solarius is a leading provider of precision systems for non-contact surface inspection, measurement, analysis, and visualization. Our products combine high-resolution sensors with automated data acquisition systems and powerful analysis tools. Offerings range from desktop systems for off-line inspection, to semi-automated systems for fast precise measurements, to customized multi-station platforms for high-volume in-line inspection.
Our design philosophy focuses on standard products as well as customized solutions to best meet specialized requirements. This process starts with understanding metrology challenges and budget constraints, followed by in depth analysis by our application and development engineers. Customizing data acquisition software, analysis tools, and user interfaces is a part of our approach to solve unique metrology application tasks.
The company’s headquarters, which includes our main product development center, is in San Jose, California. Our global reach includes Solarius subsidiaries in China (Shanghai), Europe (Munich and Essen) and India (Pune) responsible for sales, application engineering, customer support, and product development. Augmented by our international partner network Solarius takes care for an installed base exceeding 2,000 active metrology systems worldwide.
3D Metrology Systems
Solarius LaserScan Surface Profilometer
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.