Sigenics designs VLSI circuits and supplies packaged Silicon for targeted analog and mixed-signal applications.
Our mission is to remove any technical and budgetary obstacles standing between you and your ASIC (application specific integrated circuit). We can accomplish this through our proprietary ASIC design flow which allow us to offer surprisingly low NRE (non-recurring engineering) costs.
Our philosophy and proven technical performance compel us to offer you the option of distributing the NRE over the design and production cycles of your project eliminating the risk of paying a big NRE up-front for something that may not work.
Our active client base lets us offer you silicon area on shared Sigenics-sponsored wafer runs, delivering your silicon prototypes for a small fraction of the cost of a full wafer run.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.