MEMSCAP, the MEMS leader, provides innovative products and solutions based on micro-electromechanical systems, or MEMS. The company enables its customers in high-growth markets to incorporate strategic MEMS technology into their systems as a means of addressing critical technical and cost challenges. MEMS, or micro-systems, are microscopic mechanical systems that combine mechanical, optical, electromagnetic, thermic and fluidic elements with electronics on semi-conductor substrate electronics. They act as sensors able to identify physical parameters in their environment (pressure, acceleration, etc.) and/or actuators able to act on this environment.
MEMSCAP offers Standard Products that are components, modules or systems, as well as Custom Products. For Custom Products, our Group technology enables system providers who do not master MEMS, to incorporate our solutions to create new products, to improve integration, performance and reliability of existing products, and gives the key to mass production, miniaturisation, increased system speed, while reducing internal development cycles and accelerating significantly the products development cycles.
MEMSCAP’s Electrostatic Variable Optical Attenuator Completes Telcordia Qualification
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.