SVC members and the public benefit from the continued expansion of Society activities. The annual Technical Conference (TechCon) includes an in-depth Technical Program, a broad Education Program, and an Exhibit. A newsletter, a web site, a series of Educational Guides to assist in understanding vacuum coating processing, an On-Site Education Program, a Glossary of Terms Used in Vacuum Coating, and a CD-ROM and printed book of manuscripts from past Technical Conference Proceedings represent other significant resources available from the Society.
Historical presentations available on line include an article on the History of Vacuum Coating Technologies, oral interviews with people associated with the development of the vacuum coating industry, and hard-to-find historical papers.
The SVC also presents educational programs, technical papers, and exhibits on vacuum coating at the annual meetings of other professional societies. These programs have served to provide electroplaters, surface finishers, and others with an introduction to vacuum technology and vacuum coating.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.