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Results 9241 - 9250 of 12602 for Optical
  • Beam Profiler - Definition and Applications
    Article - 20 Jun 2014
    Measurement of the optical beam profile is of critical importance in a number of laser applications.
  • Researchers Produced Material That Can Bend Light in Opposite Direction
    News - 14 Oct 2007
    A Princeton-led research team has created an easy-to-produce material from the stuff of computer chips that has the rare ability to bend light in the opposite direction from all naturally occurring...
  • Total Internal Reflection - Working Principle and Applications
    Article - 12 May 2014
    Total internal reflection is the reflection of the incident light that hits a medium boundary at an angle greater than the critical angle relative to the normal to the surface.
  • Fizeau Interferometer - Definition and Applications
    Article - 1 May 2014
    Interferometric measurements can be carried out in an optical arrangement in which two or more beams originated from the same source, but passing in different paths are made to interfere....
  • Primary and Secondary Principal Planes
    Article - 29 Sep 2014
    The principal planes are two hypothetical planes found in a lens system at which all the refraction is deemed to occur.
  • What is Magnification Power?
    Article - 24 Oct 2014
    Magnifying power is defined as the ratio between the dimensions of the image and the object. The process of magnification can occur in lenses, telescopes, microscopes and even in slide projectors....
  • USPTO Grants Patent on Opsens Technology
    News - 21 Aug 2007
    Opsens Inc. has announced today that the United States Patent and Trademark Office (USPTO) has granted Opsens, patent no. 7,259,862 entitled Low-coherence interferometry optical sensor using a single...
  • Veeco Next Generation Surface Profiling System for Semiconductors from Veeco
    News - 21 Aug 2007
    Veeco Instruments Inc., today announced the release of its latest generation of industry-leading SP products for backend semiconductor metrology. The Wyko(R) SP9900(TM) Surface Profiling System...
  • What is Super-Resolution Microscopy?
    Article - 6 May 2014
    Resolution limits owing to light diffraction have always been a major problem in analysing microscopic images.
  • LED Light for Your Network
    News - 27 Jul 2007
    Thanks to rapid increases in luminous efficacy and their familiar benefits such as long life and small dimensions, LEDs are now being used more and more for general illumination. The range of...

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