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Results 81 - 90 of 1015 for Characterisation
  • High Performance Fibre-Optic Infrared Temperature Sensors
    News - 13 Sep 2007
    The Convir FL series of fibre-optic infrared temperature sensors has now grown with the addition of three new models. These new sensors extend the temperature range of the FL series enabling them to...
  • Veeco
    Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
  • Nikon Instruments Inc.
    Supplier Profile
    With over 100 years expertise in the field, Nikon has always been at the forefront of optical and technological innovation, promoting creativity and trustworthiness as part of the company's global...
  • PANalytical
    Supplier Profile
    PANalytical is the world’s leading supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF), with more than half a century of...
  • Malvern Panalytical
    Supplier Profile
    Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better...
  • Yokogawa Fluid Imaging Technologies, Inc.
    Supplier Profile
    At Yokogawa Fluid Imaging Technologies our mission is to bring clarity and focus to the study of subvisible particles in the life sciences. With our FlowCam technology, we are committed to developing...
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • What is the Difference between Ellipsometry and Reflectometry?
    Article - 18 Feb 2025
    Utilizing light reflection, ellipsometry and reflectometry provide distinct approaches to thin-film characterization, crucial for advanced material analysis.
  • Microscopy and Magnetic Characterization Analyzes London Underground Air Quality
    Article - 24 Jan 2023
    Airborne iron oxide nanoparticles in the London Underground (LU) are the subject of a recent study published in the journal Scientific Reports. The purpose of this study is to characterize the...
  • Using Surface Characterization to Control Epoxy Die Bonding
    Article - 30 Jan 2023
    This article describes the characterization of the epoxy die attachment process, its accuracy and its importance for stability.

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