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Results 81 - 90 of 207 for AFM
  • AFM Series: An Introduction to Piezoresponse Force Microscopy (PFM)
    Article - 5 Dec 2018
    Piezoresponse force microscopy (PFM) is a variation of atomic force microscopy (AFM) that uses a conductive probe tip to measure the piezoelectric, and more commonly the ferroelectric, domains of a...
  • Benefits of Combining Atomic Force Microscopy and Optical Microscopy
    Article - 27 Jun 2019
    This article discusses optical and atomic force microscopy and the advantages of combining the two.
  • Smart Imaging Technologies
    Supplier Profile
    Smart Imaging Technologies offers ready-to-run automated solutions for material science, metallurgy, nanotechnology, biology petrography and more. The SIMAGIS® smart spreadsheet provides...
  • Rhk Technology Inc.
    Supplier Profile
    The rise in prominence for scanning probe microscopies (STM, AFM, SNOM, MFM, KFM, etc) has proceeded in parallel with the growth of RHK Technology. As one of the world's leading manufacturer of...
  • Nanoscale Thermal Analysis of Polymers
    Article - 22 Jun 2009
    The Veeco Instruments Thermal Analysis (VITA) module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a...
  • Studying Intrinsically Disordered Proteins Using Atomic Force Microscopy
    Article - 30 Sep 2022
    Intrinsically disordered proteins (IDPs) play significant roles in various biological events. Due to their non-intuitive physical structures, analysis and understanding of their dynamics have proven...
  • Examining Mineral Flotation with Atomic Force Microscopy
    Article - 26 Apr 2022
    Atomic force microscopy (AFM) is an indispensable tool to image and characterize samples in colloidal states such as mineral flotation.
  • How Piezoelectric Feedback Boosts Infrared Atomic Force Microscopy
    Article - 8 Mar 2021
    Scientists at the Beckman Institute for Advanced Science and Technology at the University of Illinois have suggested a new approach to improve AFM-IR measurements' sensitivity.
  • Polytec
    Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • Using Atomic Force Microscopy to Look at Thin Ice
    Article - 22 Apr 2022
    Images of two-dimensional ice captured using atomic force microscopy (AFM) demonstrate a previously unseen growth mechanism.

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