In-depth articles written by our editorial team focusing on the latest developments in materials science and technology
Atomic force microscopy (AFM), is a powerful, versatile technique for imaging & studying surfaces & is used throughout many scientific areas & industries.
By Liam Critchley
26 Oct 2018
Thin films - a layer material between sub-nanometer & several micrometers, represented in various coatings from conformal and spray to atomically thin.
By Liam Critchley
19 Mar 2018
UPS and XPS are photoelectron spectroscopy techniques – ultraviolet photoelectron spectroscopy and x-ray photoelectron spectroscopy.
By Liam Critchley
19 Mar 2018
Both AFM & STM are surface microscopy techniques that can determine the topology of a surface & both widely used across chemical & nanoscience fields.
By Liam Critchley
19 Mar 2018
There remains a significant need to set standard methods of characterization for materials derived from material synthesis methods.
By Benedette Cuffari
15 Feb 2018
The use of interferometry for astronomical imaging has successfully been utilized in the aerospace industry since its introduction in the 1950s.
By Benedette Cuffari
12 Feb 2018
Surface Enhanced Raman Spectroscopy (SERS) is a powerful technique that is used to enhance sensitivity when using Raman spectroscopy.
By Louise Saul
8 Feb 2018
In this article, we discuss the benefits and disadvantages of both Infrared spectroscopy (IR) and Raman spectroscopy techniques.
By Louise Saul
2 Feb 2018
The non-linear imaging component of the electron microscopy technique is based on the multislice simulation of wurtzite-structure of aluminum nitride (AlN).
By Benedette Cuffari
25 Jan 2018
In order to study two-dimensional (2D) materials like graphene, Raman spectroscopy has been used most extensively.
By Benedette Cuffari
25 Jan 2018