MKS Inc., a global provider of enabling technologies that transform our world, has announced the Ophir SP403P SWIR Beam Profiler, a camera system for analyzing large-beam SWIR (shortwave IR) diagnostics across 1440-1650 nm wavelengths. Designed to address the limitations of high-cost, ITAR-controlled options, the Ophir SP403P profiler offers a cost-effective solution for SWIR applications with a large active area. The profiler provides a 12.3 mm × 12.3 mm active area and 4512 × 4512 pixels at a 2.74 μm pixel pitch for beam sizes from 600 μm to 12.3 mm. This delivers the field of view needed to analyze wide SWIR beams without cropping, ensuring detailed, repeatable beam-quality measurements in a variety of R&D and production environments, such as telecom fiber-laser process control, industrial laser processing, defense and aerospace applications, optical communications, and advanced SWIR systems.
The Ophir SP403P SWIR Beam Profiler is designed to address the limitations of high-cost, ITAR-controlled options by offering a cost-effective SWIR solution with a large active measurement area. Image Credit: MKS Inc.
"Organizations working with large SWIR beams have had to compromise between the need for a large field of view and budget," said Reuven Silverman, General Manager, Ophir Photonics Products. "With the Ophir SP403P profiler, that compromise is eliminated. A 12.3 mm active area paired with high-density 4.5 k imaging delivers the resolution and coverage needed to reduce error, speed alignment, and elevate process control at an affordable price. In addition, no export restrictions means easy global integration."
The Ophir SP403P SWIR beam profiler is delivered with state-of-the-art Ophir BeamGage® software to streamline setup, analysis, visualization, and reporting. Ophir BeamGage Professional, the industry's most advanced beam analysis software, is based on UltracalTM, MKS' proprietary baseline correction algorithm that helped establish the ISO 11146-3 standard for beam measurement accuracy. BeamGage software includes all the calculations needed to make accurate, ISO approved laser beam measurements, including power and spot diameter, power density, spot position, and more. The software provides advanced image processing features, NIST-traceable power measurements, trend charting, data logging, pass/fail production testing, and multilingual support.
A powerful yet easy-to-use system, the Ophir SP403P profiler also includes a compact USB 3.0 interface for effortless deployment from lab benches to automated lines.
Availability
The Ophir SP403P SWIR Beam Profiler is available now.