Scanning Near-Field Optical Microscopes (SNOM)

Scanning Near Field Optical Microscopy (SNOM/NSOM) is a form of scanning probe microscopy that allows optical imaging with spatial resolution beyond the diffraction limit. This is done by placing the detector very close to the specimen surface in the region called "optical near-field".

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Equipment

WITEC alpha300 S Scanning Near-Field Optical Microscope

The alpha300 S is a user friendly Scanning Near-field Optical Microscope (SNOM) that combines in a unique way the advantages of SNOM, Confocal Microscopy and Atomic Force Microscopy in a single instrument. Switching between the different modes can easily be done by rotating the objective turret. The alpha300 S uses unique micro-fabricated SNOM-cantilever sensors for optical microscopy with spatial resolution below the diffraction limit.

XE-NSOM Near-Field Scanning Optical Microscope (NSOM) and Raman Spectrometer from Park Systems

The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM offers a complete AFM system setup with unprecedented adaptability for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology.

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