Optical Characterization Systems

Optical Characterization refers to the use of optical techniques to study of solid-state and biological phenomena at the nanoscale.
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Featured Equipment
The SPF-290S is a recording UV spectrophotometer designed and optimized for the determination of SPF values on a variety of sunscreen and cosmetic products reducing the need (and cost!) for in-vivo testing.
Other Equipment
The ImageMaster® Universal 3D instrument completes the ImageMaster® Universal family to enable the full field measurement without rotating the sample under test.
The new OptiCentric® 3D provides an ideal solution for the complete opto-mechanical characterization of assembled optical systems. This approach integrates different lens analysis technologies and provides a valuable tool for the evaluation of complex optical systems in R&D or routine quality inspection in production.
During assembly of a new experimental setup or application, it is essential to choose the right detector for measurement and display of a laser signal in terms of energy or power or its time-resolved behavior.
The Stage-RTL-T is a novel sampling system for analysis of substrate materials such as silicon, metals, glass and plastics. The RTL-T couples to Ocean Optics' spectrometers and light sources, and can be configured in a variety of setups, for reflection and transmission measurements.
µPhase® interferometers offer objective and precise measurement results of surface and wavefront measurements - quickly and reliably. µPhase® interferometers are compact, small and lightweight digital tools which can be used in almost any working environment. These measuring devices are perfectly complemented by the µShape™ measurement and analysis software to fulfill the highest expectations of quality management.
The OptiCentric MAX is a successor to the OptiCentric® MOT 300 instruments. It is designed to measure and also to assemble extremely large, heavy lenses. The instrument is used in the adjustment of wafer stepper lenses, for example.
Sarfus 3D is a complete solution that allows to visualize in real-time molecular thin films with a xy resolution of 0.35µm, and to perform thickness measurement with a z-sensitivity better than 3Å. You will access to 3D representations of the samples and to information such as surface topology, roughness, profile section… The package includes SARFUS VISU + a certified calibration standard + a 2D-3D software + a topographic treatment software (Mountains® technology).
Surfs are contrast-enhanced supports on which the samples to study are deposited. Their specific optical properties are due to a precise control of the layers deposited on a substrate. Surfs can be used in different environments (air, water, oil…) and exists with different top-layers (SiO2, TiO2, organic, SAMs…) and different sizes.
You are interested in visualization or detection of isolated objects or thin layers having nanometric dimensions. Nanolane can provide you with an economical solution. SARFUS VISU is an innovative optical technique that increases the sensitivity of standard optical microscope to a point it becomes possible to directly visualize nanometric films (down to 0.3 nanometer) and isolated nano-objects in real-time without any labeling or pre-treatment.
OptiSurf® is the ideal tool for non-contact center thickness and air gap measurement within single lenses, planar optics and optical systems. The instrument is based on low coherent interferometry and measures all distances in an optical system with an accuracy of 1 µm in one scan.
The TriAngle 3D electronic autocollimators represent high-precision angle measurement systems for high demands on angle resolution and measuring accuracy.
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