Equipment | Thin Film Characterization Equipment

Thin Film Characterization Equipment

The importance of thin films is growing. Consequently, being able to accurately characterize properties of thin films is of the utmost importance. Properties such as film thickness, refractive index, transmission and reflection need to be measured.
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Equipment
In-Line Film Thickness Monitoring with Spectroscopic Reflectometer - Angstrom Sun Technologies
The Angstrom Sun Technologies Integrated Solution for In-Line Film Thickness Monitoring with Spectroscopic Reflectometer is an easy to use system for monitoring film thickness and refractive index. Features and applications of the system are outlined herein.
Spectroscopic Ellipsometer for Film Thickness Measurement The SE200BA from Angstom Sun Technologies
The Spectroscopic Ellipsometer SE200BA Film Thickness Measurement System is a powerful instruments used to precisely measure thin film thickness, determine optical constants, investigate surface and interface phenomenon and many other physical, chemical and optical properties of materials.
Spectroscopic Reflectometer and Film Thickness Measurement System SR300 from Angstrom Sun Technologies
The SR300 Spectroscopic Reflectometer & Film Thickness Measurement System can be used to measure the film thickness, refractive index, reflection, transmission and absorption spectra of thin films and coatings.
NanoCalc Thin Film Reflectometry System from Ocean Optics
The optical properties of thin films arise from reflection and interference. The NanoCalc Thin Film Reflectometry System allows you to analyze the thickness of optical layers from 10 nm to ~250 µm.
Film Thickness Mapping Measurement System SRM100 from Angstrom Sun Technologies
The SRM100 Film Thickness Mapping Measurement System can measure the film thickness and refractive index across samples as big as 300x300mm. Features and applications are provided herein.
MSP100 Microspectrophotometer and Film Thickness Measurement System from Angstrom Sun Technologies
The MSP100 Microspectrophotometer and Thin Film Measurement System is used to characterize optical properties of thin films, thick coatings over a micron region area.
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