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Results 61 - 70 of 372 for Materials inspection

New Reflected Light Microscope for Materials Scientists from Carl Zeiss

News - 12 Oct 2010

Carl Zeiss introduces the Axio Lab.A1 microscope for examinations in reflected light in the materials sciences. It’s particularly intuitive operation makes this upright microscope suitable for...
EyeCheck Thermo 400 – Smart Thermal Imaging Camera

News - 21 Mar 2016

EVT presents the new EyeCheck Thermo 400. This is an intelligent thermal imaging camera with a microbolometer sensor for detecting infrared radiation between 8 and 14 µm. The sensors are...
Laser-Based X-Ray Machine Could Help Prevent Nuclear Terrorism

News - 22 Dec 2015

Physicists at the Diocles Extreme Light Laboratory at the University of Nebraska-Lincoln have demonstrated that their unconventional laser-based X-ray machine could provide a new defense against...
DUV and VUV Microlithographic Objective Optical Designs

Article - 13 May 2020

Microlithographic objectives were developed for DUV and VUV wavelengths used for printing and inspection applications related to microlithographic processes.
ChemImage Receives Funding to Study and Develop Space-Based Optics

News - 9 Dec 2007

ChemImage, a leader in Chemical Imaging technology, recently received an SBIR Phase I grant for studying Silicon Carbide (SiC) based materials for space-based optics. This Phase I grant will fund...
Streamlining Micro-Indentation Testing Reveals Mechanical Properties of Bone

News - 14 Jan 2016

Presenting a faster and more efficient alternative to electron microscopy, digital light microscopy has been advancing investigations into the mechanical properties of bone, as explored in a new...
Carl Zeiss Introduces METROTOM 800 X-Ray-Based Coordinate Measuring Machine

News - 9 Apr 2009

With a new member in the METROTOM® family, Carl Zeiss is once again setting standards in CT-based coordinate measuring technology: The new METROTOM 800 computer tomograph was specifically...
Basics of Interferometry, 2nd Edition

Book

Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface...
Nikon Appointed as Official European Distributor of NeoScope Benchtop SEM

News - 2 Dec 2008

Nikon Instruments Europe and JEOL have announced an agreement that appoints Nikon as the official European distributor of the innovative NeoScope benchtop SEM (scanning electron microscope)....
Significant Supplier in the Fast Emerging Flexible Display and OLED Markets

News - 23 Oct 2008

NexTech Solutions, Inc. and FAS Holdings Group, LLC, jointly doing business as "NexTechFAS," are pleased to announce that it will be exhibiting at the 4th Global Plastic Electronics...