Search

Sort by:

Relevance
Date

Results 331 - 334 of 334 for Camera

Measurement and Correction of Aberrations Using SPAM and Deformable Lens Module

Article - 13 Jan 2022

This article looks at Furieri, T. et al.'s research paper which analyzes a method to achieve anisoplanatic aberrations in a small optical module that can identify and correct aberrations.
MicroLED Displays: Measuring and Correcting Uniformity

Article - 22 Feb 2021

MicroLED displays have impressive visual performance. However, there are issues. As they are individual emissive elements, microLEDs can show high variability in image properties, measuring and...
DUV and VUV Microlithographic Objective Optical Designs

Article - 13 May 2020

Microlithographic objectives were developed for DUV and VUV wavelengths used for printing and inspection applications related to microlithographic processes.
Factors to Consider When Selecting a Stereo Microscope

Article - 24 May 2012

Stereo microscopes are often called the workhorse of the lab, and selecting the right one for your purposes is very important. Daniel Goeggel from Leica Microsystems runs down the most important...

Previous
1
...
31
32
33
34

Mounts and Mounted Optics for Optical Components

Mounts and Mounted Optics for Optical Components

This product profile describes the features and applications of Mounts and Mounted Optics.

From Optical Surfaces Ltd.

ARL EQUINOX 3000 XRD for Research

ARL EQUINOX 3000 XRD for Research

The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.

From Thermo Fisher Scientific - Elemental Analyzers and Phase Analyzers

$Filmetrics® F40: Measure Thickness and Refractive Index$

Filmetrics® F40: Measure Thickness and Refractive Index

KLA’s Filmetrics F40 allows you to transform your benchtop microscope into an instrument to measure thickness and refractive index.

From Filmetrics, a KLA Company