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Results 301 - 308 of 308 for Analysis and measurement

Advantages of Using Dektak Surface Profilers with Vision 3D Analysis Software

Article - 22 Jun 2009

This application note describes the advantages of 3D measurement options available through a combination of Veeco's Dektak Stylus Profiler and Vision 3D analysis software.
Automatic Step Detection Feature for Dektak Surface Profilers

Article - 22 Jun 2009

Dektak stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.
Nanoscale Thermal Analysis of Polymers

Article - 22 Jun 2009

The Veeco Instruments Thermal Analysis (VITA) module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a...
Optical Profiling Increases Yield and Lower Overall Production Cost of Solar Cells

Article - 22 Jun 2009

The rapid, accurate, and versatile metrology solutions offered by Veeco's stylus and optical profilers are being utilized by many solar cell manufacturers to increase yield and lower the overall...
P8000 Series High-Speed Polarimeter Characterized by Excellent Measurement Speed

Article - 9 Aug 2008

The NEW Model P8000-Series Polarimeters from A.KRÜSS Optronic is characterized by excellent measurement speed over their entire range. A special measuring method provides continuously calculated...
Microlensing and Adaptive Optics Helping to Discover New Exoplanetary Systems

Article - 16 Feb 2008

Article updated on 03/03/20 by Ben Pilkington Harnessing the work in gravitational microlensing, supercomputer modeling and adaptive optics pioneered at the Lawrence Livermore National Laboratory...
Detecting Fugitive Environmental Contaminants

Article - 3 Jan 2008

The intentional or accidental release of contaminants into the environment is an inevitable consequence of human activity.
In Confocal Raman Imaging - Acquisition Time for One Raman Spectrum is a Crucial Value

Article - 10 Nov 2007

This article describes how the use of a spectroscopic EMCCD as the detector can significantly reduce the acquisition time down to a few milliseconds per spectrum, as well as tremendously improving...

Featured Equipment

Monarc Pro T System: An Advanced Solution for Photoactive Catalyst Studies

The Monarc Pro T System turns any microscope into an optically-coupled microscope, enabling in-situ discovery for photoactive catalyst studies.

From Gatan, Inc.

TAMS: Total Absolute Measurement System

The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.

From PerkinElmer