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Results 31 - 40 of 215 for Atomic Force Microscopy
  • Nikon Instruments Inc.
    Supplier Profile
    Nikon Instruments Inc. is a leading provider of microscopes, cameras, and related technologies for the clinical, educational, research, biotech, and other markets. With over 100 years of optical...
  • PhotoMetrics Inc.
    Supplier Profile
    Since 1970, PhotoMetrics has been solving production and failure analysis problems through chemical analysis and materials characterization. We are a commercial analytical laboratory located in...
  • Nanoscience Instruments. Inc.
    Supplier Profile
    Nanoscience Instruments combines expertise in microscopy and surface science instrumentation with real-world solutions. We partner with innovative instrument manufacturers around the world to help...
  • Armadillo SIA
    Supplier Profile
    Armadillo SIA is an exclusive supplier of specialty fiber optic solutions, including raw fiber, pigtails, patch cords, and custom assemblies. Engineered to support your application and meet your...
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative instrumentation...
  • MS MacroSystem
    Supplier Profile
    MS MacroSystem offers professional 3D and 4D graphics software for science and technology that allows you to analyze data quickly and accurately. Our unique set of interactive 3D measurement tools was...
  • Combining Atomic Force Microscopy and Optical Microscopy to Study the Interaction Between Dopamine and D1-Receptor in SH-SY5Y Cells
    Article - 22 Jun 2009
    In the present study we investigated the potential application of force measurements in monitoring the response and binding properties of dopamine D1 receptor upon stimulation with dopamine.
  • High-Resolution Imaging of Native Lens Membranes and Constitutive Protein Components Using Atomic Force Microscope
    Article - 22 Jun 2009
    In this application note, we demonstrate the utility of AFM in delineating the cause of cataracts. High-resolution imaging of native lens membranes and the constitutive protein components was achieved...
  • Advantages of Using Dektak Surface Profilers with Vision 3D Analysis Software
    Article - 22 Jun 2009
    This application note describes the advantages of 3D measurement options available through a combination of Veeco's Dektak Stylus Profiler and Vision 3D analysis software.
  • Automatic Step Detection Feature for Dektak Surface Profilers
    Article - 22 Jun 2009
    Dektak stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.

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