Luna Technologies, a division of Luna Innovations Incorporated, announces the expansion of its fiber optic test platform with the release of the Optical Vector Analyzer (OVA) ELp. This new instrument is designed to characterize the polarization properties of fiber optic components for high-speed optical networks. Using the industry standard for measuring polarization mode dispersion (PMD), the OVA ELp is a fast, economical tool that provides industry-leading accuracy and resolution in a single sweep of a tunable laser and offers a dynamic range in excess of 50 dB.
The OVA ELp is ideal for loss and polarization characterization of passive optical components in the S, C and L communication bands and ports easily from the lab to the manufacturing floor. When used in conjunction with an external tunable laser, the OVA ELp quickly and accurately measures critical component performance indicators such as insertion loss (IL), polarization dependent loss (PDL), polarization mode dispersion (PMD), second order PMD, Jones matrix elements, TE/TM-Loss, and time domain or filter impulse information. The OVA ELp provides investment protection with an upgrade path that allows for the addition of test and measurement options based upon user need, such as chromatic dispersion (CD), group delay (GD), and phase.
¡§Pressure continues to mount on component vendors to perform thorough and rapid component characterization including polarization effects such as PDL and PMD,¡¨ comments Dr. Brian Soller, Vice President and General Manager of Luna Technologies. ¡§Vendors can find themselves struggling to scale their measurement capacity to keep up with added volume and the variety of new testing requirements including PMD. The introduction of the OVA ELp gives our customers an economical starting point with an upgrade path to a full Vector Analyzer.¡¨