Feb 4 2011
Provider of electron microscopes, FEI has launched a new range of high-resolution scanning electron microscopes (UHR SEMs) for material science applications.
The Nova NanoSEM 50 SEMs offer accurate analysis and enhanced nanometer-scale resolution on a diverse range of samples.
Nova NanoSEM 50 Microscope
The Nova NanoSEM microscope is capable of inspecting insulating samples in low vacuum and can inspect the samples in the same kind of resolution obtained in high vacuum. It features low vacuum and beam deceleration capabilities from previous models of microscopes, in addition to the Helix detector that delivers low-noise, high-contrast imaging. The microscope features sample & chamber cleaning solutions, which is vital for low kV high-resolution imaging.
The Nova NanoSEM 50 Series microscope features a collection of retractable and in-lens and detectors, making it ideal for scanning transmission electron microscopy, backscattered electron and secondary electron signal collection and filtering. The microscope has a 110 mm stage with a 75º motorized tilt that allows electron back-scattered diffraction analysis.
The microscope provides a 150 mm piezo-electric stage for quick and accurate navigation. It features various beam chemistries, an integrated 16-bit pattern generator, and swift beam blanking for lithography and prototyping applications.
Source: http://fei.com/