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Results 41 - 50 of 396 for Surface profiling
  • Supplier Profile
    Angstrom Engineering was founded in 1992 and has quickly grown into a global company with a reputation for providing high-quality machines and unparalleled customer service. Our PVD equipment is...
  • Supplier Profile
    Eye Vision Technology develops tools to create machine vision solutions using simple drag-and-drop interfaces. All EVT tools run on all hardware platforms, vision sensors, smart cameras, embedded...
  • Supplier Profile
    Fill the market of laser-induced breakdown spectroscopy by delivering state-of-art technology. Lightigo develops instruments designed with a focus on high performance, stability and user experience....
  • Supplier Profile
    Telops specializes in the design and production of sophisticated optoelectronic systems for defense, industrial and academic research applications. A reliable source of accelerated innovation...
  • Supplier Profile
    With over 35 years of experience, Ophir Photonics, a Newport Corporation company, provides a complete line of instrumentation including power and energy meters, beam profilers, spectrum analyzers, and...
  • Article - 17 Apr 2017
    Model-based CSI enables precise surface and film thickness metrology, crucial for diverse applications, with robust, sample-agnostic calibration.
  • News - 10 Nov 2009
    Surface texture plays a vital role in the functionality of a component. It is estimated that surface effects cause 10% of manufactured parts to fail and can contribute significantly to an advanced...
  • News - 10 Nov 2009
    Optical Profiler ZeScope is a high-value, high-resolution alternative to run of the mill optical profilometers: it delivers superior, Angstrom-level height accuracy, in a wide open versatile...
  • News - 16 Oct 2019
    Microlens arrays are gaining a significant amount of attention due to the growing demand for miniaturization of optoelectronics. Microlens arrays have become a crucial micro-optics device extensively...
  • Article - 7 May 2020
    Measuring symmetric aberrations in large departure aspheric surfaces to a nanometer precision using non-contact profilometry is discussed.

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