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Results 211 - 217 of 217 for Organic polymer

Analyzing Polymers with Microscopy: Principles and Applications

Article - 29 Mar 2022

The microscopic characterization of polymers is key to the understanding of the fundamental structure-function relation on a molecular level and paves the way toward the rational design of novel and...
TEM Vs SEM: Comparing Different Types of Electron Microscopy

Article - 21 Mar 2022

Electron microscopy has opened new worlds of detail in materials science, eclipsing the capabilities of conventional light microscopes with much higher resolution. Various types of electron...
Atomic Force Microscopy: General Principles and Applications

Article - 7 Dec 2021

Atomic force microscopy (AFM) is a powerful microscopy technique. It is used to acquire high-resolution images at the nanoscale to better understand the properties of matter.
Current and Future Raman Spectroscopy Applications

Article - 2 Dec 2021

Raman spectroscopy is a powerful tool for analyzing a wide range of different materials. Since it was discovered, the technique has been employed to investigate material features such as carbonaceous...
Optical Adhesives - Optically Clear Coatings, Adhesives, Encapsulants, and Impregnants

Article - 2 Aug 2010

Master Bond's optically clear polymer compounds are widely used for coating, bonding and encapsulating.
Nanoscale Thermal Analysis of Polymers

Article - 22 Jun 2009

The Veeco Instruments Thermal Analysis (VITA) module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a...
Chemistry of Materials: American Chemical Society Publications

Journal

Chemistry of Materials is devoted to the publication of original contributions on forefront, fundamental research at the interface of chemistry, chemical engineering, and materials science. Both...

Featured Equipment

TAMS: Total Absolute Measurement System

The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.

From PerkinElmer