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Results 51 - 55 of 55 for Lithography

Real-Time Picosecond Observation of Magnetic Vortex Core’s Gyration with a Delay Line Detector

Article - 30 Oct 2021

Extracting information about dynamic processes in the picosecond (ps) requires extensive modification and optimal control of the operation conditions. This research, published in Ultramicroscopy...
Production and Engineering Optical Design Compensation

Article - 12 May 2020

Many optical systems call for precision optical designs, which need significant optical engineering to support the manufacturing team.
Selecting Surface Metrology Instruments with a Criteria of Lateral Resolution and Instrument Transfer Function

Article - 19 Jul 2017

The constraints of the optical metrology instruments selected for process and quality control have to be understood very clearly as Manufacturers of optics and high-precision machined parts...
Advances in Photonic Devices for Optical Computing

Article - 6 Aug 2007

The goal of improving on computer speed has resulted in the development of the Very Large Scale Integration (vlsi) technology with smaller device dimensions and greater complexity.
Using Ultrathin Nanostructured Coatings in Conventional Optics

Article - 25 Nov 2021

Transparent materials influence the phase evolution of transmitted radiation, however, chromatic dispersion is an issue. Ossiander, M et al.'s article published in Nature Communications experimentally...

Featured Equipment

Monarc Pro T System: An Advanced Solution for Photoactive Catalyst Studies

The Monarc Pro T System turns any microscope into an optically-coupled microscope, enabling in-situ discovery for photoactive catalyst studies.

From Gatan, Inc.

TAMS: Total Absolute Measurement System

The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.

From PerkinElmer