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Results 1 - 10 of 92 for Atomic Force Microscopy
  • Article - 1 May 2024
    Optical metrology advances precision in aerospace, automotive, and electronics with techniques like PSI and CSI for quality control.
  • Article - 22 Apr 2024
    Ultrashort pulse lasers, emitting light in incredibly brief bursts, have revolutionized various scientific and technological fields.
  • Article - 11 Apr 2024
    Microscale LEDs enhance biomedical imaging and therapy, offering precise, minimally invasive options for applications like photodynamic therapy (PDT).
  • Article - 28 Mar 2024
    AFM revolutionizes biomedical research by providing nanoscale imaging, crucial for early cancer detection and cell mechanics analysis.
  • Article - 21 Sep 2023
    Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and...
  • Article - 18 Sep 2023
    The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust...
  • Article - 3 Aug 2023
    Atomic force microscopy (AFM) has become an essential characterization tool in polymer research due to its unique capacity for multifunctional, nanoscale imaging and measurement. Recent advances have...
  • Article - 26 Jul 2023
    Since its invention in the 1980s, the atomic force microscope (AFM) has become indispensable for nanoscale imaging and metrology across scientific fields. At the heart of the AFM lies a host of...
  • Article - 24 Jul 2023
    While AFM is commonly used for imaging in air and vacuum environments, the question arises: Can AFM be used for imaging in liquids? In this article, we will delve into the challenges and possibilities...
  • Article - 14 Jul 2023
    Characterizing the surface topography of materials and devices is vital to determine their mechanical and physical properties. This article will look at the field of surface metrology and how atomic...

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