Filmetrics, Inc. was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, commercial thin-film measurement instruments cost $50,000 or more and required operators to have advanced training. Single measurements took several minutes, even hours.
The Filmetrics approach was to design an affordable purpose-built miniature spectrometer system, whose low cost had just recently been made possible by advances in silicon detector array technology. We combined this with sophisticated software that integrated advanced thin-film expertise into a simple, intuitive Windows interface. The result was the F20, a compact system with astounding speed and accuracy, which line operators could be trained to use in a matter of minutes – all at a mere fraction of the cost of traditional instruments.
Today, Filmetrics is a wholly-owned subsidiary of KLA Corporation and an important member of the KLA Instruments™ family. Filmetrics continues to offer not only a full line of thin-film metrology systems and accessories but also the world’s first affordable 3D profilometer, the Profilm3D. Filmetrics also offers ProfilmOnline, a browser-based software platform for storing, sharing, viewing, and analyzing 3D images from profilometers, AFMs, and other 3D microscopes.
Filmetrics® F20 Thin-Film Analyzer: Accurate, Affordable, Reliable
The Filmetrics® F54-XY-200 for Thickness Measurement
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
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AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.