Jul 16 2007
HORIBA Jobin Yvon introduces the GD-PROFILER 2 with new high speed electronics that improve the depth resolution to < 1 nm.
HORIBA Jobin Yvon GD-PROFILER 2
The system also features the renowned Pulsed RF Source that handles even thermally sensitive conductive and non-conductive layers with ease. The unique HDD Detectors for each element providing an instantaneous dynamic range of 10 decades that allow any element to be determined at the ppm level in one layer and at 99+% in the next. The new compact housing features a large sample chamber that is useful for a wide variety of applications.
The speed, depth resolution, total depth probed and low cost of the GD-PROFILER™ 2 make it a superb alternative to other surface analysis techniques.
http://www.jobinyvon.co.uk