Feb 14 2008
Zygo Corporation today announced its next-generation of leading 3D Optical Profilers, the NewView 7000-series. These products are designed for rapid, precise, and quantitative surface metrology for the production and scientific research markets.
Available in two platforms -- the 7300 and 7200 -- the NewView™7000-series sets a new industry benchmark with significant gains in performance. Based on proprietary scanning technology, the NewView™7000 delivers leading precision sub-nanometer z-resolution with the highest speed in its class. New enhancements include an ultra high-speed scanner with improved linearity, improved signal to noise ratio, increased illumination output, next-generation electronics with encoded stages, and a new suite of machine vision tools. With its unique combination of advanced performance features, precision and flexibility, the NewView™7000-series delivers optimal value making it one of the most advanced 3D optical metrology instrument available today for production and research.
"Our NewView™7000 line with industry-leading speed and precision provides significant advantages for applications requiring production-level 3D metrology and process control. We believe that this level of performance and value will be well received by the industry, while meeting the needs of our most demanding customers," commented Jim Northup, President of ZYGO's Metrology Solutions Division.