Bruker Optics, part of the Bruker Corporation is one of the world’s leading manufacturer and worldwide supplier of Fourier Transform Infrared, Near Infrared and Raman spectrometers.
Bruker entered the field of FTIR spectroscopy in 1974. The early instruments set new standards in research FTIR with evacuable optics, high resolution and automatic range change. Since then, the product line has been continuously expanding with instruments suitable for both analytical and research applications with exceptional performance characteristics.
Today, Bruker Optics offers complete technical solutions for various markets which cover a broad range of applications in all fields of research and development as well as industrial production processes for the purpose of ensuring quality and process reliability.
Bruker Optics’ R&D and manufacturing center is located in Ettlingen, Germany, technical support centers and sales offices are located throughout Europe, North and South America, Asia, India, Middle East and Africa.
Bruker is three-time winner of the iF DESIGN AWARD 2019
Bruker Releases ONET Software for Administration of FT-NIR Spectrometer Networks
MIR-FIR Spectroscopy in One Step - An FT-IR Dream Becomes a Reality
Bruker Optics Introduces the CryoSAS for QC of Silicon Materials
Bruker Optics TANGO FT-NIR Spectrometer - Ease of Use
Bruker’s VERTEX FM-Far and Mid IR Spectroscopy
ISTFA 2013 Tools of the Trade - Demonstration of Bruker Optic's LUMOS
TANGO FT-NIR Spectrometer from Bruker for Chemical Analysis
Tango Near Infrared Spectrometer for Quality Control from Bruker
MPA II Multi-Purpose FT-NIR from Bruker
INVENIO from Bruker
Handheld Raman Spectrometer - BRAVO
MultiRAM Stand Alone FT-Raman Spectrometer from Bruker Optics
PMA 50: Polarization Modulation Measurements
Monitoring Air At Industrial locations - The Open Path Air Monitoring System from Bruker
MATRIX-MG Gas Analyzers: Real-Time Monitoring of Gas Compounds
HTS-XT Microplate Extension from Bruker
FT-IR Spectrometer for OEMs - IR Cube from Bruker Optics
FT-IR Spectrometer - IFS 125 from Bruker Optics
Bruker Optics: Remote Sensing - HI 90
Bruker Optics: EM27 Open Path Spectrometer
Bruker Optics - SIGIS 2 Remote Sensing
SENTERRA II Compact Raman Microscope from Bruker
RAM II FT-Raman Module from Bruker
SiBrickScan (SBS) Silicon Ingot Analyzer from Bruker
VERTEX 80/80v FTIR Spectrometer from Bruker
CryoSAS All-In-One Cryogenic Silicon Analysis System
FT-IR Microscope - Hyperion from Bruker Optics
FT-IR Imaging and Microscopy: LUMOS II
FT-NIR Spectrometer - TANGO from Bruker
FT-IR Spectrometer - MATRIX MF from Bruker Optics
FT-IR Spectrometer - ALPHA II from Bruker Optics
Bruker Optics MATRIX-F FT-NIR Spectrometer
From Raw Materials to Final Products: Applications of FT-NIR and XRF in Feed Production
High Sensitivity Silicon QC Using FT-IR Spectroscopy
In-Depth Surface Analysis: How to Utilize FT-IR for the Analysis of Coatings, Surface Treatments and Technical Cleanliness
Easy and Reliable FT-IR Instrument for Your Analytical Labs
Getting Your Lab Ready for Microplastic Analysis by FT-IR Spectroscopy
The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.
KLA’s Filmetrics F40 allows you to transform your benchtop microscope into an instrument to measure thickness and refractive index.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
Dr. David Dung
We spoke with University of Bonn spin-off Midel Photonics, a start-up company whose laser beam shaping technology is hoping to sharpen up the laser industry.
Matthias Sachsenhauser, Ph.D.
Following Laser World of Photonics 2022, we spoke with Matthias Sachsenhauser from Hamamatsu Photonics about the role of laser-driven light sources in the future of the photonics sector.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.