Established in 1979, Santec is a global photonics engineering company and a leading manufacturer of Tunable Lasers, Optical Test and Measurement Products, Advanced Optical Components and biophotonics. Products include Tap Photodetectors and Arrays, VOAs, MEMS VOAs, WDM filters, Mux and Demux products, Tunable Lasers, Tunable Filters, PER Meters, LCOS based WSS module, Scanning lasers for optical coherent tomography.
Santec is one of the pioneering companies that defined the Optics Industry as it exists today. Over a twenty-two year period, Santec has made a series of strategic shifts to become one of the leaders in the optoelectronics business sectors. We developed a series of original optical products and have garnered the attention of users throughout the marketplace worldwide. Currently we are the supplier of choice to a number of Japanese manufacturers in the fields of communication equipment, electrical equipment and cabling.
The explosive growth of the Internet in the late 1990s served to speed the full-scale implementation of large-capacity, high-speed optical communication networks. The development of Wavelength Division Multiplexing (WDM) technology generated an even greater demand for key optical devices, and helped transform our optical components from mere research tools to practical devices offering quality sufficient to withstand the rigors of real-world use.
During this period we obtained an ISO 9001 certification and became recognized worldwide as a force in the realm of communications technology. Santec's products passed quality audits by Lucent Technologies, CIENA, Ericsson and others, and were incorporated in transmission devices by many of the world's most prominent manufacturers.
Santec Receives FDA Approval for ARGOS®
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.