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COXEM has been manufacturing Scanning Electron Microscopes (SEM) since 2008 after licensing technology developed with KRISS, the Korean Research Institute for Science and...

Safematic Coating Modules – Changing The Face Of SEM And Thin Film Sputter Coating

News - 20 Oct 2017

The choice of sputter coater has often been a compromise between either fine grain coating for SEM or the ability to rapidly deposit a wide range of materials for thin film and advanced EM...

Hitachi High-Tech, RIKEN Jointly Launch MirrorCLEM to Simplify Correlative Light and Electron Microscopy

News - 22 Jul 2016

Hitachi High-Technologies Corporation (Hitachi High-Tech) and RIKEN, one of Japan’s national institutes for scientific research, announced today that they have jointly developed...

False-Colored SEM Image of Sea Urchin Tooth Earns Top Honors

News - 1 Feb 2013

Close your eyes and picture an ocean reef: vivid violet, cool blue and tropical green intertwining in gentle curves and delicate edges. And that's just the urchin teeth. "We take many...

TESCAN Announces Delivery of 1000th VEGA-3 Variable Pressure SEM

News - 12 Sep 2012

TESCAN, a major manufacturer and provider of focused ion beam workstations and scanning electron microscopes, has announced the delivery of its 1000th VEGA-3 variable pressure scanning electron...

Zeiss SEM Used to Uncover New Evidence of Feather Color in Winged Dinosaur

News - 23 Apr 2012

Carl Zeiss Microscopy, LLC, announces that it participated in a major research study that uncovered new evidence of feather color in the winged dinosaur Archaeopteryx The research team used the...

Field Emission SEM Helps Understand Hypersensitivity Benefits of Clinpro Toothpaste

News - 15 Feb 2012

A nanoscale analysis conducted by McCrone Associates using field emission scanning electron microscopy has provided the visual evidence for patient-reported hypersensitivity advantages of Clinpro...

Carl Zeiss Celebrates 10 Years of CrossBeam FIB-SEM Technology

News - 18 Dec 2011

Carl Zeiss Microscopy, a company of the Carl Zeiss Group and leading provider of light, laser-scanning and electron and ion beam microscopes, today announced the celebration of its tenth anniversary...

Manipulate Samples In An SEM with a miBot from Imina Technologies

News - 9 Nov 2011

What is the size of a gambling die, zips around a microscope stage at 2mm/s but can stop on a dime with nanometer precision, then manipulate and probe anything from biological cells to semiconductors,...

TESCAN Launches Plasma Source FIB Integrated Field Emission SEM

News - 7 Oct 2011

TESCAN has launched a high-resolution Schottky field emission scanning electron microscope (SEM) named the FERA3 XMH with a built-in xenon plasma source-based focused ion beam (FIB). TESCAN has...