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The Electro-Optic Effect: Fundamentals of Electro-Optic Modulators

Article - 28 Feb 2013

An applied voltage is increased by a factor of approximately 100 across the electro-optic crystal by a tuned rf cavity (tank circuit).

Advanced Filter Technology from Lasers to Displays

Article - 3 Dec 2012

In this interview, Adam Brierley, Director of Brinell Vision, talks to AZoOptics about their thin-film filter and filter glass products, and their capabilities in the field of laser safety.

FTE-8000 Optical Spectrum Analyzer – Introduction and Benefits of FTE-8000 Optical Spectrum Analyzer

Article - 13 Oct 2010

The FTE-8000 Optical Spectrum Analyzer is the most rugged and affordable full featured Mini OSA on the market. it is available in up to 88 channels in the C and L bands with 50 and 100 GHz channel...

Product Solutions for Photovoltaic Electroluminescence Imaging

Article - 3 Sep 2010

As solar cells have come of age, there has been an increasing demand for photovoltaic modules to become more efficient at solar energy conversion.

Determining Refractive Index Using PR21 Process Refractometer

Article - 29 Apr 2010

The process refractometer PR21 of A.KRÜSS Optronics, Hamburg, is a universal measuring instrument for determining the refractive index and therefore the concentration of a substance in liquid in a...

LIDAR System Uses Optical Surfaces Off-Axis Beam Expander to Monitor Inner City Atmospheric Pollution

Article - 8 Dec 2009

Optical Surfaces works with the Remote Sensing Group at the Defence Evaluation and Research Agency and the Civil Engineering Department of Salford University.

South African Astrophysical Observatory Selects Schmidt Camera Optics from Optical Surfaces

Article - 8 Dec 2009

The South African Astrophysical Observatory acquires high precision optics from Optical Surfaces.

Telescope Project Selects Optical Surfaces to Supply High Precision Spectrograph Optics

Article - 8 Dec 2009

Optical Surfaces has been selected by Observatoire Midi-Pyrénées for the supply of high precision optics that will be used in the ESPaDOnS project.

Combining Atomic Force Microscopy and Optical Microscopy to Detect Changes in Cell Morphology

Article - 22 Jun 2009

The high resolution imaging capability of AFM has recently facilitated the construction of atomic models of supramolecular assemblies from topographical images of photosynthetic proteins and channel...

Advantages of Using Dektak Surface Profilers with Vision 3D Analysis Software

Article - 22 Jun 2009

This application note describes the advantages of 3D measurement options available through a combination of Veeco's Dektak Stylus Profiler and Vision 3D analysis software.