News - 19 Mar 2010
OFC/NFOEC 2010 takes place March 23 - 25, 2010 at the San Diego Convention Center in San Diego, CA.
Follow OFC/NFOEC on Twitter: @ofcnfoec
Breaking news releases, advisories, photos, and...
News - 5 Jan 2010
What started out as ‘blue-sky’ thinking by a group of European researchers could ultimately lead to the commercial mass production of a new generation of optoelectronic components for...
News - 9 Dec 2009
General Mills’ completely renovated and expanded photography studios are among the largest in-house, full-service food photography and food styling studios in the country. Photographs for all General...
News - 27 Oct 2009
Provides Enhanced Solutions for POS System Displays and Portable Data Terminals
Mitsubishi Electric Corporation (TOKYO:6503) announced today it has developed a 12.1-inch XGA color TFT-LCD module...
News - 21 Oct 2009
SC654, SC657, SC658 fit in 2x2mm ultra-thin plastic package and drive 6, 5, 4 LEDs, respectively, using one-wire SemPulse® digital interface
Semtech Corp. (Nasdaq: SMTC), a leading supplier of...
News - 18 Sep 2008
Magnetic resonance scans will be safer for children and other patients needing anaesthesia, thanks to new kinds of optical sensors developed by a team of European researchers.
News - 3 Jul 2008
Acoustic waves play many everyday roles - from communication between people to ultrasound imaging. Now the highest frequency acoustic waves in materials, with nearly atomic-scale wavelengths, promise...
Article - 8 Aug 2023
Lasers are increasingly playing a crucial role in different fields, such as entertainment, computing, medicine, instrumentation, telecommunications, and manufacturing, specifically additive...
Article - 30 Mar 2022
The aerospace industry is increasingly turning to fiber optics to bear data and communications in the avionics systems of next-generation aircraft. This is due to the technology’s clear size, weight...
Article - 31 Mar 2021
Scanning microwave impedance microscopy (sMIM) can be used to obtain information about the electrical properties of a material as well as its metrology.