News - 28 Jan 2010
LEDs measured on the test bench can produce different photometric and color results in actual operation mounted on the PC board. Also measuring slight color and flux differences between discrete LEDs...
Article - 21 Jan 2020
Find out more about the advanced optical measurement systems that can be used to characterize MEMS devices.
News - 6 Apr 2010
Tektronix, Inc., the market leader in broadcast video test, monitoring and analysis solutions, today announced that it will roll out a series of enhancements to its entire lineup of waveform monitors...
News - 16 Apr 2020
Radiant Vision Systems, a leading provider of imaging systems for measurement of light sources and displays, announces that it will host a webinar to introduce its Auto-POI software feature, a quick...
News - 25 May 2009
At this year's Intersolar dated May 27th to 29th in Munich it's possible to see the joint solution for layer thickness measurement from the companies tec5 and VITRONIC: State-of-the-art inline...
The privately owned company of InfraTec GmbH Infrarotsensorik und Messtechnik has its headquarters in Dresden, Germany and was founded in 1991. Today, it is a fully integrated company with its own...
News - 3 Oct 2013
FUJIFILM Corporation (President: Shigehiro Nakajima) will launch three types of UVSCALE, the world's first* UV light amount distribution measurement film that visualizes light amount distribution...
News - 17 Dec 2009
X-Rite, Incorporated (NASDAQ: XRIT), the world leader in color management, measurement and communication technologies, today announced that its recently-announced EasyTrax, the industry’s most...
Article - 11 Feb 2019
This article discusses how to use optical measurement to characterize MEMS Devices.
News - 9 Aug 2017
Image Credits: Gamma Scientific
The new Gamma Scientific GS-1160B Spectroradiometer is the most advanced compact lightweight industrial /(desktophandheldbenchtop) spectroradiometer/flicker...