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  • Model-Based Transparent Surface Films Analysis
    Article - 17 Apr 2017
    Model-based CSI enables precise surface and film thickness metrology, crucial for diverse applications, with robust, sample-agnostic calibration.
  • Measuring High Power Lasers
    Article - 2 Dec 2015
    Gary Wagner, President of Ophir-Spiricon, spoke to AZoOpitcs about how extremely powerful lasers are driving new innovations in manufacturing and the military, the difficulties researchers face when...
  • Thirty Years of Experience in Supplying Custom LEDs
    Article - 25 Nov 2015
    AZoOptics speaks to Marktech Optoelectronics' CEO, Mark Campito, President, Bill Moore, and CTO, Vincent Forte about their extensive product range.
  • OLED Technology in Display Screens
    Article - 15 Nov 2012
    Large OLED displays have been promised for a long time, but are only now beginning to come to market. Are OLEDs really better than LCDs, and why are they so difficult to commercialize?
  • MicroLED Displays: Measuring and Correcting Uniformity
    Article - 22 Feb 2021
    MicroLED displays have impressive visual performance. However, there are issues. As they are individual emissive elements, microLEDs can show high variability in image properties, measuring and...

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