Analysis and testing - AZoOptics Search

New Tektronix 45GHz Optical Modulation Analyzer Supports Next-Gen 400G Communications

News - 26 Mar 2015

Tektronix, Inc., the world's leading manufacturer of oscilloscopes, today unveiled a new 45 GHz optical modulation analyzer (OMA) capable of supporting the latest 100G and next-gen 400G...

World Leader in Scientific Imaging and Spectroscopy Solutions Launches Komet 6.0

News - 3 Sep 2008

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announced today the release of KometR 6.0, the leading software for imaging and analysis of comet assay...

OFC 2016: Teledyne LeCroy, Anritsu, Coherent Solutions and Oclaro to Demonstrate Latest 400G Test Platform

News - 10 Mar 2016

Teledyne LeCroy, Anritsu Company, Coherent Solutions Ltd. and Oclaro, Inc. today announced a new joint effort to demonstrate the highest performance single-carrier 16QAM signal generation and analysis...

Yokogawa Introduces AQ6375B Optical Spectrum Analyser for Short-Wavelength Infrared Region

News - 1 Oct 2015

The new Yokogawa AQ6375B is an optical spectrum analyser operating in the short-wavelength infrared (SWIR) region covering wavelengths from 1200 to 2400 nm. With a design based on the company's...

Analyzer Fills the Gap of Amplitude and Phase-Modulated Optical Signal Analysis

News - 10 Mar 2009

Agilent Technologies Inc. (NYSE: A) today introduced the industry's first time-domain based optical modulation analyzer offering in-depth analysis of amplitude and phase-modulated optical signals....

EXFO Expands Portable Fiber-Optic Test Equipment Portfolio

News - 28 Jan 2014

EXFO Inc. today announced the addition of the FIP-430B Fully Automated Fiber Inspection Probe to its portfolio of portable fiber-optic test equipment. One-step process - 100% automated Built to...

Successful Accomplishment of Cryogenic Testing of WEBB Telescope Mirrors

News - 23 Dec 2011

Cryogenic testing for the last six primary mirror segments and a secondary mirror has been accomplished, and is all set to take wings on NASA's James Webb Space Telescope. This achievement...

Innovative New Microscopy Tool Combines High-Res Digital Imaging with Laser-Cutting Capabilities

News - 11 Nov 2008

SUSS MicroTec Test Systems (FWB:SMH)(GER:SMH), the premier supplier of wafer-level test solutions for semiconductor devices, today announced the iVista(TM) LC High-Resolution Digital Microscope. Its...

Lightest and Smallest 40G Testers on the Market

News - 12 Feb 2008

JDSU today introduced the T-BERD/MTS-8000 40G Transport module, an easy-to-use 40G field installation and maintenance tester. One of the lightest and smallest 40G testers on the market, the 40G...

New Approach to Analyse Surfaces with Different Reflectivities

News - 19 Dec 2007

Due to their stable design, Fizeau interferometers are used to determine the topography of surfaces such as, e.g., plane surfaces. PTB has now developed a method which makes it possible to analyse...