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Results 1 - 10 of 308 for Analysis and measurement
  • High-Precision Optical Metrology Techniques and Their Principles
    Article - 27 Nov 2023
    Optical metrology is the science of making precise measurements using light-based techniques. It enables non-contact characterization and inspection across diverse fields, including semiconductor...
  • Wavefront Analysis for High-Resolution Imaging Systems
    Article - 16 Oct 2023
    Wavefront analysis is used extensively to measure and characterize the wavefront of light beams in different applications, including optical testing, microscopy, and high-resolution imaging. This...
  • An Introduction to Thermal Imaging
    Article - 12 Oct 2023
    The utilization of specialized Infrared cameras consisting of infrared sensors to capture and develop the image of an object constitutes the process of thermal imaging. Our eyes detect visible light;...
  • Analyzing Light Propagation in Microscale Structures Using Geometrical Optics
    Article - 5 Oct 2023
    This article discusses the importance of geometrical optics, recent developments in this field, and the application of geometrical optics for light propagation analysis in microscale structures,...
  • Optical Testing for Semiconductor Devices
    Article - 29 Sep 2023
    This article explores how key optical methodologies are applied to inspection, metrology, and analysis at various stages of semiconductor research, development, and volume manufacturing.
  • How Is Electron Microscopy Used to Characterize Catalysts?
    Article - 26 Sep 2023
    With advanced resolutions reaching sub-angstrom levels, electron microscopy provides direct visualizations of catalyst particles, support structures, and pores that complement spectroscopic and...
  • Using AFM to Study Membranes in Water Treatment Facilities
    Article - 21 Sep 2023
    Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and...
  • The Major Steps for Image Analysis of Particles
    Article - 20 Sep 2023
    Image analysis of particles is one of the key methods for particle characterization. This article discusses the major steps during the image analysis of particles.
  • Surface Topography Imaging with AFM
    Article - 18 Sep 2023
    The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust...
  • Green Lasers in LiDAR Technology
    Article - 7 Sep 2023
    Green lasers have undeniably elevated the capabilities of LiDAR technology, enabling precise and efficient 3D mapping of our surroundings. Their enhanced visibility, compatibility with silicon-based...

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