News - 5 Nov 2020
After the successful 3rd virtual edition of the 2020 NSFE, we are excited to invite researchers from all fields of Scanning Probe Microscopy to the fourth edition of the NanoScientific Forum Europe as...
News - 6 Aug 2020
Atomic force microscopy (AFM) brought the atomic scale imaging resolution of scanning tunnelling microscopy, a technique that won the Nobel Prize in Physics, to non-conducting surfaces.
News - 23 Jul 2020
KAIST researchers used atomic force microscopy to quantitatively evaluate how acidic and sugary drinks affect human tooth enamel at the nanoscale level.
This novel approach is useful for measuring...
News - 21 Jul 2020
Oxford Instruments Asylum Research announces an upcoming webinar titled “Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy.” Surface roughness is a...
News - 29 Jun 2020
At the Beckman Institute for Advanced Science and Technology, scientists have designed the latest technique to enhance the detection ability of nanoscale chemical imaging by making use of atomic force...
News - 25 Jun 2020
As technology shrinks, the need to characterize the properties of very small materials-measured in nanometers (1 nanometer = 1 billionth of a meter)-has become increasingly important.
News - 10 Jun 2020
Park Systems, a world-leading innovator in atomic force microscopy (AFM), proudly announces the opening of a new European subsidiary in Nottingham, United Kingdom.
For well over a decade, Park...
News - 23 Apr 2020
Material science innovations are critical to the semiconductor industry’s efforts to make more powerful and more energy efficient processors and data storage devices. Hafnium oxide is one such...
News - 27 Mar 2020
New substrate preparations, thin film deposition technologies, and coating processes are producing ultra-low roughness surfaces that are below the measurement resolution of conventional optical and...
News - 23 Mar 2020
Oxford Instruments Asylum Research announces the release of accessories enabling environmental control and nanoelectrical measurements on the Jupiter XR large-sample atomic force microscope (AFM).The...