Hitachi has opened a new Advanced Scanning Electron Microscope Facility in the Cavendish Laboratories, Cambridge University. The long standing research collaboration between Hitachi and the Cambridge University has been enhanced with the installation of three state of the art scanning electron microscopes. The new facility will make some of Hitachi’s unique instruments, including the S-5500 in-lens SEM, openly accessible to university researchers.
Small Matters: Exploring the World of Microscopy will be officially opened by the University of Sydney's new Vice-Chancellor and Principal Dr Michael Spence, on Wednesday, 6 August, 2008.
Hitachi Ltd and Hokkaido University prototyped an electron analysis microscope that produces an enlarged image by irradiating an electron beam from a scanning electron microscope (SEM) to a specimen and analyzing the diffraction pattern of the scattered light.
India's International Centre for Material Science (ICMS) in Bangalore has selected FEI Company and its Mumbai-based agent, Icon Analytical Equipment Private Limited, to develop a unique imaging facility. It will be the most advanced electron microscopy facility in India and highlights the global technology leadership of FEI and its products.
Nanopoint Inc., an award-winning developer of cellTRAY® Fluidics and Imaging System products, is announcing positive validation of its Model CT-2000 from early customers who range professionally from microfluidics system experts to award-winning pharmaceutical researchers.
Researchers at the California Institute of Technology have turned science fiction into reality with their development of a super-compact high-resolution microscope, small enough to fit on a finger tip.
Sandia National Laboratories will demonstrate a new hyperspectral confocal fluorescence microscope Friday, Aug. 8 from 9 a.m.-2 p.m. MDT in Bldg. 897 on Kirtland Air Force Base. This patent-protected and patent-pending technology has been combined with Sandia's unique and proprietary multivariate algorithms and software to form a complete system for the extraction of quantitative image information from hyperspectral images.
Carl Zeiss SMT yesterday was presented with a 2008 Editors' Choice Best Product Award from Semiconductor International magazine in recognition of the revolutionary break-through performance of its ORION(TM) Helium Ion Microscope. The Best Product Awards are presented annually to acknowledge those products that deliver the level of excellence needed to succeed in today's and tomorrow's semiconductor industry.
A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures.
Nikon Instruments Inc. announced its new Dynamic Auto-Focus unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV semiconductor inspection microscope series and OEM applications. Featuring the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large focus range and fast tracking ability through a combination of slit projection and contrast detection auto focus. The result is a highly-versatile system that can be used for a wide range of imaging techniques.
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