Unfortunately, the Cypher is *too stable* - making it utterly useless as an earthquake detector ??. (4/4)
?? Find ou… https://t.co/TR8hSY8Qhx
Aug 12 2022 11:54am
Asylum's co-founder Roger Proksch was in the lab working on an interferometric PFM experiment, when suddenly there… https://t.co/JdIIRcBwD1
After surveying the building for damage, he realized that the Cypher had continued scanning throughout the quake. W… https://t.co/dWjD4BUHDG
Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications. Founded in 1999, we are dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 300 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, data storage and semiconductors, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more.
Technological Leadership and Leading Innovation
Precision and accuracy has been the driving force behind the pioneering AFM instrument innovations in flexure design, lowest-noise closed loop sensors, and full digital control. These are now requirements in any research grade AFM. Our open software, based in IGOR Pro, allows researchers the ease-of-use, and power and flexibility to take their experiments to the next level. These innovations, just to name a few, are offered in our two main product lines-the Cypher™ and MFP-3D™ AFM Families.
Cypher, the Highest Resolution Fast Scanning AFM – Now with Environmental Control
The Cypher AFM is the highest resolution fast scanning AFM now with environmental control. Cypher provides low-drift, lowest noise, closed loop atomic point defect resolution for the most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On™ automated laser and photodetector alignment for easy setup, and integrated thermal, acoustic and vibration control.
MFP-3D, Unmatched Precision, Power and Versatility
The MFP-3D sets the standard for AFM technology for larger samples with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise, closed-loop feedback sensor technology, and numerous environmental accessories, making it the most versatile and powerful AFM available. Four models comprise the family:
More Built-in and Advanced Scanning Modes
Our AFMs support all major AFM/SPM scanning modes and capabilities with many exclusive
advanced scanning modes for many different applications:
Lowest Cost of Ownership and Industry-best Warranties
Asylum now includes the industry's only five-year warranty free of charge with all Cypher, MFP-3D and NanoIndenter Systems. The MFP-3D Origin™ includes a full two-year warranty – still best in class among other AFMs in its price range. The warranties cover all parts and labor, including shipping and any required travel expenses, for problems occurring due to normal usage. The cost is $0 to the user, making Asylum AFMs the lowest in cost of ownership. Because of our robust, reliable systems, you can be sure that the cost of ownership will remain low even beyond the warranty period. In the unlikely event that a repair is needed, you can be assured of the fastest turnaround time in the industry.
Oxford Instruments Asylum Research Announces Upcoming Webinar: “Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy”
Oxford Instruments Asylum Research Releases New White Paper: “Measuring Surface Roughness with the Jupiter XR Large-Sample Atomic Force Microscope”
Upcoming Asylum Research Webinar “Probing Nanoscale Structure & Properties of Polymers: Advances in Atomic Force Microscopy,” October 16, 2019
The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.
KLA’s Filmetrics F40 allows you to transform your benchtop microscope into an instrument to measure thickness and refractive index.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
Dr. David Dung
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Matthias Sachsenhauser, Ph.D.
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