Since 1864 the guiding line of the family owned SCHMIDT + HAENSCH is to combine tradition with high quality innovation. Since the introduction of new reference methods in the sugar industry, the company is a leading producer of analysing instruments. The main emphasis lays on the analysis in the laboratory, comprising manless analysing automats as well as data acquisition systems for the laboratory.
Development, production and distribution of “classical” laboratory instruments is one of the branches of SCHMIDT + HAENSCH. Another branch are the so called “intelligent process sensors”.
Differences in the concentration of liquids of various provenience can be measured directly with a process refractometer. Also additional parameters like turbidity and other proofs specific to the substance can be determined with high reliability.
Cross-linking laboratory instruments according to the customers requirements completes the pretentious product scale of SCHMIDT + HAENSCH.
Schmidt + Haensch Polartronic H532 Automatic Polarimeter
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.