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Results 611 - 620 of 622 for Microscopic

Application of Atomic Force Microscopy in Bitumen Materials

Article - 28 Sep 2022

Modern microscopic methods such as atomic force microscopy (AFM) have significantly increased our understanding of bitumen microstructure. This article will discuss this topic further, looking at...
Topological Semimetal Based Photodetector for High-Speed and Low-Energy Photon Harvesting

Article - 18 May 2022

Researchers have confirmed the chemical inertness of PtSe2 surfaces to ambient gases (oxygen and water) and, as a result, the long-term durability of PtSe2-based devices using synchrotron-based...
Using Atomic Force Microscopy for Molecular Structure Elucidation

Article - 8 Dec 2021

Molecular structure elucidation by atomic force microscopy (AFM) has been demonstrated as a powerful method to gain insights into the structure and formation of matter.
Evaluating Novel Optical Temperature Mapping Modality to Overcome Limitations of Existing Optical Instruments

Article - 18 Nov 2021

Looking at Liu, X et al's paper published in Nature Communications, this article describes video-rate upconversion temperature sensing in wide-field utilizing single-shot photoluminescence lifetime...
Using PIV to Measure Shielding Gas Flow in GMAW

Article - 30 Oct 2019

Particle Image Velocimetry (PIV) was used in this case to measure shielding gas flow in Gas Metal Arc Welding (GMAW) with a CAVILUX HF Diode Laser.
Model-Based Transparent Surface Films Analysis

Article - 17 Apr 2017

Surface metrology is expected to deal mostly with the presence of sub-micron thick films, which are currently used on products well beyond semiconductor devices.
CCD Cameras in Ophthalmology

Article - 31 Aug 2016

Ophthalmic imaging is a specialized form of medical imaging dedicated to studying and treating eye disorders. Ophthalmic diagnostic imaging integrates science and art to provide images to record the...
Advances in Photonic Devices for Optical Computing

Article - 6 Aug 2007

The goal of improving on computer speed has resulted in the development of the Very Large Scale Integration (vlsi) technology with smaller device dimensions and greater complexity.
Employing Pinhole-Type Lightfield Monitors to Overcome Chromatic Aliasing

Article - 2 Nov 2021

The article evaluates the ability of pinhole-type lightfield monitors to provide a convincing 3D experience—images with enough brightness and continuous aspect. The research was published in the...
What Impacts the Price of a Confocal Microscope?

Article - 9 Aug 2021

Understand what factors impact the price of a confocal microscope.