Search

Search Results

Results 8391 - 8400 of 8467 for Laser

How Can Coded Light-Sheet Array Microscopy Improve 3D Imaging?

Article - 26 May 2020

A newly-developed imaging technique called Coded Light-Sheet Array Microscopy (CLAM) improves upon existing 3D imaging approaches.
Silicon Wafer Brillouin Spectroscopy

Article - 19 May 2020

Brillouin spectrum of a silicon wafer, obtained by using a camera cooled only at -5 °C, restricting the exposure time to ten seconds due to the dark current.
Plastic Film Brillouin Spectroscopy

Article - 12 May 2020

This article looks at the process of brillouin spectroscopy on a common food wrap plastic film and the results that are gained.
The Hybrid Microscope and the Future of Cancer Diagnosis

Article - 7 Apr 2020

A new hybrid microscope has been developed that could create digital biopsies that will transform the field of cancer diagnosis.
How the Mirrored Chip May Lead the Way to Handheld Dark-Field Microscopes

Article - 11 Mar 2020

In February 2020, a team of engineers reported the development of a technique that was able to enhance dark-field microscopy using a small, mirrored chip to generate images in place of the expensive...
How to Evaluate Optical Coating Suppliers for Risk Reduction

Article - 3 Mar 2020

Risk reduction is essential when sourcing optics for critical applications such as in defense or aerospace. Find out how to evaluate optical coating suppliers.
Optical Filter Solutions for Satcom Systems

Article - 12 Feb 2020

This article discusses the optical filter solutions that are available to satcom systems.
The Future Developments of Atomic Absorption Spectrometry

Article - 12 Feb 2020

Atomic absorption spectrometry (AAS) is a technique that has undergone significant development since the first work with spectroscopy was described back in 1648.
Exploring the Most Recent Developments in Quantum Optics

Article - 5 Feb 2020

A growing body of research is focusing on exploring the interactions of atoms and molecules with individual quanta of light, known as photons.
Interference Filters in Reflection

Article - 5 Feb 2020

This page discusses applications of the interference filters in reflection.

Featured Equipment

TAMS: Total Absolute Measurement System

The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.

From PerkinElmer