Laser - AZoOptics Search

Recognizing Faulty Manufacturing in the Solar Industry

Article - 1 Nov 2018

The SolarEye plug-in can be used to help recognize faulty manufacturing in various markets, including the solar industry.

Optical Communication in Non-Invasive Surgery

Article - 31 Oct 2018

Optical fibers are now being incorporated into medical procedures, in the form of optical sensors for surgery.

Explaining Water Anomalies with Spectroscopy

Article - 26 Oct 2018

This article discusses how spectroscopy can be used to explain water anomalies.

Nonlinear Ghost Imaging: A New Terahertz Imaging Concept

Article - 27 Sep 2018

In this interview, we speak to Dr Juan Sebastian Totero Gongora and Prof. Marco Peccianti about a novel THz Imaging concept they have developed called Nonliner Ghost Imaging.

Looking Into The Diverse Area Of Wearable Optics

Article - 9 Aug 2018

Wearable optics come in many different forms, from the low-tech aesthetics by integrating optical fibers with clothing, to newly created advanced optical sensors and creating high-tech applications,...

The Different Types of Spectroscopy for Chemical Analysis

Article - 10 Jul 2018

This article studies the different types of spectroscopy that can be used for chemical analysis.

Using Raman Spectroscopy To Characterize Nanomaterials

Article - 10 Apr 2018

Raman spectroscopy, which uses the inelastic scattering of light falling on a material, is used for the characterization of materials (including nanostructures) because it is a non-destructive, fast,...

An Introduction to Fluorescence Spectroscopy

Article - 4 Apr 2018

Spectroscopy is a broad technique, with many different types available to researchers. Each type of spectroscopy measures different bandwidths of radiation, and can be used to determine different...

A Multipurpose Silicon Photonics Processor Core

Article - 27 Sep 2017

Photonic integrated circuits (PICs) are an area of growing research and are now present in many applications.

Model-Based Transparent Surface Films Analysis

Article - 17 Apr 2017

Surface metrology is expected to deal mostly with the presence of sub-micron thick films, which are currently used on products well beyond semiconductor devices.