Electroluminescence Testing System for HB-LED Epiwafers - LumiMap from Bruker

The LumiMap Electroluminescence System integrates spectral and electrical testing of epitaxial HB-LED wafers in one, simple, intuitive test environment offering instant data without any wafer preparation.

The LumiMap uses a non-destructive touch probe to send controlled current through wafer. This current excites the active GaN layer, causing it to emit light.

Proprietary, patent-pending features of the new metrology system include an innovative wafer edge contact solution, a durable conducting probe and advanced IV curve modelling for precise and repeatable forward voltage (Vf) measurements.

Key Features

The key features of the LumiMap system are:

  • Measures forward and reverse IV characteristics precisely and consistently
  • Characterizes current-induced wavelength, spectral intensity and spectral width
  • Offers long-term Vf accuracy and repeatability via patent-pending probe design and edge contact
  • Enables strong correlation with device-level measurements using advanced IV modelling
  • Shortens acquisition of critical data from days to minutes
  • Provides immediate feedback on MOCVD process quality, with no wafer preparation required
  • Delivers nondestructive, multi-point inspection in seconds


Other Equipment by this Supplier

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.