This article discusses deconvolution in optical microscopy.
By Meet A. Moradiya
30 Oct 2018
Scanning Spreading Resistance Microscopy (SSRM) is a variation of AFM that employs a conductive tip in contact mode to measure the resistance of a surface in combination with a high force.
By Liam Critchley
5 Dec 2018
Scanning capacitance microscopy (SCM) is a technique that takes operational principles from both atomic force microscopy (AFM) and scanning probe microscopy (SPM).
By Liam Critchley
5 Dec 2018
In MFM, the tip detects the magnetic interactions at the surface of the material and builds up a spatial distribution map of the material’s magnetic structure.
By Liam Critchley
5 Dec 2018
EFM is one of the few methods where it is an adaptation of just AFM principles for deducing specific properties of materials.
By Liam Critchley
5 Dec 2018
C-AFM is a type of AFM mode that uses a sharp conductive tip (often a conductive diamond-coated silicon tip).
By Liam Critchley
5 Dec 2018
AFM has become a widely used technique for many reasons. It is most frequently used to determine the topography of a surface.
By Liam Critchley
5 Dec 2018
Atomic force microscopy (AFM) is a powerful and versatile microscopy technique that has been used across many scientific disciplines for decades. While it is a single technique, there are many ways in which it can be used.
By Liam Critchley
5 Dec 2018
Piezoresponse force microscopy (PFM) is a variation of atomic force microscopy (AFM) that uses a conductive probe tip to measure the piezoelectric, and more commonly the ferroelectric, domains of a material.
By Liam Critchley
5 Dec 2018
In this interview AZoNetwork spoke to STEMMER IMAGING about The importance of software solutions in the future of machine vision.