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Results 41 - 50 of 847 for Metrology
  • Veeco
    Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
  • Scientific Computing International
    Supplier Profile
    SCI is a world leader in providing high resolution thin-film metrology systems and analysis software products to leading companies in the semiconductor, optoelectronics, data storage, display, MEMS,...
  • Metris Changes Corporate Name to Nikon Metrology
    News - 12 Nov 2009
    The corporate name of Metris is changed into Nikon Metrology NV. Under the Nikon brand, Nikon and Metris will synergize their respective strengths with regards to technology, marketing and services,...
  • Luna Technologies
    Supplier Profile
    LUNA Technologies, a division of Luna Innovations Incorporated (NASDAQ: LUNA), specializes in advanced solutions for fiber optic test and measurement. Our award-winning product line includes the...
  • Yissum Research Development Company of the Hebrew University of Jerusalem
    Supplier Profile
    Yissum is the technology transfer company of the Hebrew University of Jerusalem (HU). It is responsible for marketing the inventions and know-how generated by the University's renowned researchers...
  • J.A. Woollam
    Supplier Profile
    The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide...
  • Nova's New Hybrid Metrology Concept Combines Optical and X-Ray Technologies
    News - 30 Jun 2016
    Nova Measuring Instruments, a leading innovator and a key provider of metrology solutions for advanced process control used in semiconductor manufacturing, announced today a new hybrid metrology...
  • Olympus Show Off Confocal Laser Scanning Microscope at International Metrology Show
    News - 15 May 2011
    Olympus attended the recent International Conference on Metrology and Properties of Engineering Surfaces, where it displayed its advanced measuring confocal laser scanning microscopy, the LEXT...
  • Olympus LEXT OLS4000 Being Used to Develop Standards in Optical Metrology
    News - 7 Apr 2011
    The Olympus LEXT OLS4000 is being used as a benchmark tool for the development of good practice guidelines and new reference standards in optical metrology. With both of these projects being detailed...
  • Olypmus to Exhibit at Internatihnal Metrology Conference
    News - 31 Mar 2011
    Olympus has today announced that it will be exhibiting at the 13th International Conference on Metrology and Properties of Engineering Surfaces. Hosted by the National Physics Laboratory (NPL), the...

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