J.A. Woollam alpha-SE Spectroscopic Ellipsometer

For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film, and press measure. You have results within seconds.

Why an alpha-SE?

Push button operation with advanced software that takes care of the work for you.

Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques.

Work with your materials - dielectrics, semiconductors, organics, and more.

The power of spectroscopic ellipsometry at a reasonable price.

Hundreds of wavelengths simultaneously collected in seconds - immediate results.

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