The EDX Pocket III was specifically developed by Skyray Instrument for on-site elemental analysis. It can analyze elements in solids, liquids, and powders. It can be equiped for Elemental Analysis, Plating Thickness Analysis and RoHS Compliancy Testing.
Built with the latest technology and backed by years of research and development, the all new EDX Pocket 3 XRF Spectrometer matches performance, efficiency and reliability of the bench-top spectrometers .Combined with its small, light and convinient design that provides its users with rapid, non-destructive analysis anywhere it can provide the accurate and precision results required from the analyst.