LOT-Oriel proudly announces the availability of NEW J A Woollam T-Solar™ Ellipsometer - optimised to measure the widest range of Photovoltaic Thin Films.
The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples.
Based on the established M-2000® rotating compensator spectroscopic ellipsometer, T-Solar measures hundreds of wavelength across the UV-Visible-NIR.
To improve performance on rough, textured surfaces that significantly reduce reflected signal, T-Solar combines a special High-Intensity Lamp source with our new Intensity-Optimizer.
T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In addition, it features an adjustable tilt-rotation-stage*, which is required to align the pyramid structures of alkaline-etched monocrystalline surfaces.
- Textured Mono- and Multicrystalline Substrates
- AR Coatings (SiNx, AlNx...)
- Transparent Conductive Oxides
- a-Si, µc-Si, poly-Si
- CdTe, CdS, CIGS
- Organic PV Materials
- Dye Sensitized Films
For more information please go to http://www.lot-oriel.com/ or contact Heath Young on 01372 378822, e-mail [email protected].