Jan 18 2010
LOT-Oriel are proud to announce a free two week evaluation of the J A Woollam Alpha-SE™ Spectroscopic Ellipsometer.
The new generation Alpha SE™ JA Woollam line of ellipsometers now comes with FOUR angles of incidence for modelling complex layered samples & also an optional liquid cell.
This ellipsometer makes SE measurements fast and simple.
The Alpha-SE™ will measure both thickness and refractive index with the use of CompleteEASE™ : the most powerful analysis ellipsometry software currently on the market.
With the compact, fully integrated design and USB connection make the ultimate table top tool, at an affordable price.
* Subject to availability of instrument