Posted in | News | Optics and Photonics

Free Two Week Evaluation of JA Woollam Alpha-SE Spectroscopic Ellipsometer Now Available from LOT-Oriel

LOT-Oriel are proud to announce a free two week evaluation of the J A Woollam Alpha-SE™ Spectroscopic Ellipsometer.

The new generation Alpha SE™ JA Woollam line of ellipsometers now comes with FOUR angles of incidence for modelling complex layered samples & also an optional liquid cell.

This ellipsometer makes SE measurements fast and simple.

The Alpha-SE™ will measure both thickness and refractive index with the use of CompleteEASE™ : the most powerful analysis ellipsometry software currently on the market.

With the compact, fully integrated design and USB connection make the ultimate table top tool, at an affordable price.

* Subject to availability of instrument

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