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Results 51 - 60 of 197 for AFM
  • Article - 7 Dec 2021
    Understanding the interactions at the water-solid interfaces at the molecular level has been challenging. However, advancements in atomic force microscopy (AFM) have enabled atomic resolution imaging...
  • Supplier Profile
    NanoImages, LLC is the North American distributor (USA and Canada) for SEC Co. Ltd. of Suwon, South Korea. NanoImages currently distribute the SEC Series of Tabletop SEM (Scanning Electron...
  • Supplier Profile
    Nikon Instruments Inc. is a leading provider of microscopes, cameras, and related technologies for the clinical, educational, research, biotech, and other markets. With over 100 years of optical...
  • Supplier Profile
    Nanoscience Instruments combines expertise in microscopy and surface science instrumentation with real-world solutions. We partner with innovative instrument manufacturers around the world to help...
  • News - 31 Aug 2010
    Developer of scanning probe/atomic force microscopy (AFM/SPM), Asylum Research has provided the MFP-3D-BIO AFM and Cypher AFM to the Department of Chemical and Biomolecular Engineering at the...
  • News - 12 Dec 2007
    The National Institute of Standards and Technology (NIST) has developed an imaging system that quickly maps the mechanical properties of materials - how stiff or stretchy they are, for example - at...
  • News - 5 Dec 2007
    A multidisciplinary team of UCLA scientists was able to differentiate metastatic cancer cells from normal cells in patient samples using leading-edge nanotechnology that measures the cells'...
  • News - 4 Dec 2007
    Veeco Instruments Inc., announced the introduction of its new InSight(TM) 3D Automated Atomic Force Microscope (AFM) Platform, the only metrology system available with the accuracy and precision...
  • Article - 8 Dec 2021
    Molecular structure elucidation by atomic force microscopy (AFM) has been demonstrated as a powerful method to gain insights into the structure and formation of matter.
  • Article - 14 Jul 2023
    Characterizing the surface topography of materials and devices is vital to determine their mechanical and physical properties. This article will look at the field of surface metrology and how atomic...

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